材料科学
硅
电解质
X射线光电子能谱
阳极
化学工程
傅里叶变换红外光谱
碳酸乙烯酯
石墨烯
衰减全反射
氧化物
电极
纳米技术
物理化学
化学
光电子学
工程类
冶金
作者
Fei Dou,Yangyang Sun,Xiaotian Guo,Chenhui Yin,Huijie Zhou,Guorong Chen,Huan Pang,Dengsong Zhang
标识
DOI:10.1021/acsami.4c13878
摘要
The interfacial reaction of a silicon anode is very complex, which is closely related with the electrolyte components and surface elements' chemical status of the Si anode. It is crucial to elucidate the formation mechanism of the solid electrolyte interphase (SEI) on the silicon anode, which promotes the development of a stable SEI. However, the interface reaction mechanism on the silicon surface is closely related to the surface components. This work systematically investigates the interfacial reaction mechanism on silicon materials with three representative coatings of graphene, TiO2, and SiO2 by ex situ X-ray photoelectron spectroscopy (XPS) and dynamic analysis in operando attenuated total reflection–Fourier transform infrared (ATR-FTIR), in situ revealing the different ring-opening mechanisms of fluoro-ethylene carbonate (FEC) and ethylene carbonate (EC) on different silicon surfaces with varying electrical conductivities. Due to the different ring-opening mechanisms, the final decomposition product of FEC on the graphene/electrolyte interface is stable LiF, while on the oxide (native SiO2 or emerging TiO2) interface, it forms an unstable solid lithium compound •CH2CHFOCO2Li. This study demonstrates that the formation mechanism of the SEI on silicon-based electrodes is related to the electron conductivity of surface elements, providing a theoretical basis for further optimization of silicon-based composite materials.
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