单层
等离子体子
电子转移
飞秒
光电发射电子显微术
材料科学
纳米颗粒
电子
半导体
表面等离子体子
纳米技术
等离子纳米粒子
超短脉冲
化学物理
光电子学
化学
电子显微镜
光化学
光学
激光器
物理
量子力学
作者
Jinglin Tang,Yaolong Li,Sheng Ye,Pengzuo Jiang,Zhiwei Xue,Xiaofang Li,Xiaying Lyu,Qinyun Liu,Shijin Chu,Hong Yang,Chengyin Wu,Xiaoyong Hu,Yunan Gao,Shufeng Wang,Quan Sun,Guowei Lü,Qihuang Gong
出处
期刊:Nano Letters
[American Chemical Society]
日期:2024-02-20
卷期号:24 (9): 2931-2938
被引量:1
标识
DOI:10.1021/acs.nanolett.4c00324
摘要
Plasmon-induced hot-electron transfer at the metallic nanoparticle/semiconductor interface is the basis of plasmon-enhanced photocatalysis and energy harvesting. However, limited by the nanoscale size of hot spots and femtosecond time scale of hot-electron transfer, direct observation is still challenging. Herein, by using spatiotemporal-resolved photoemission electron microscopy with a two-color pump–probe beamline, we directly observed such a process with a concise system, the Au nanoparticle/monolayer transition-metal dichalcogenide (TMD) interface. The ultrafast hot-electron transfer from Au nanoparticles to monolayer TMDs and the plasmon-enhanced transfer process were directly measured and verified through an in situ comparison with the Au film/TMD interface and free TMDs. The lifetime at the Au nanoparticle/MoSe2 interface decreased from 410 to 42 fs, while the photoemission intensities exhibited a 27-fold increase compared to free MoSe2. We also measured the evolution of hot electrons in the energy distributions, indicating the hot-electron injection and decay happened in an ultrafast time scale of ∼50 fs without observable electron cooling.
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