电压
材料科学
过程(计算)
击穿电压
兴奋剂
光电子学
阈值电压
半导体器件
电子工程
电气工程
计算机科学
工程类
纳米技术
晶体管
操作系统
图层(电子)
作者
Shouguo Zheng,Jian Zhang,Xinhua Zeng,Zelin Hu,Zede Zhu
出处
期刊:Advances in intelligent and soft computing
日期:2012-01-01
卷期号:: 155-163
标识
DOI:10.1007/978-3-642-27334-6_19
摘要
A VDMOS cell structure based on semiconductor physics and relevant states were designed. The process parameters of the high-voltage VDMOS have been calculated and ajusted. Using the optimal device’ dimensions, the doping concentration was ananlyzed systematically. Additionally, a simulating model of VDMOS was compiled based on SENTAURUS PROCESS. According to this model simulation, an optimized device parameters’ design was further determined. Finnally, the device drain-source breakdown voltage has satisfied a standard value of 1200V. Whereas its threshold voltage is 3.9V, which is in the prerequisite range of 3~ 5V.
科研通智能强力驱动
Strongly Powered by AbleSci AI