钼
铟
材料科学
兴奋剂
电子迁移率
溅射沉积
薄膜
溅射
氧化物
分析化学(期刊)
电阻率和电导率
霍尔效应
光电子学
无机化学
冶金
化学
纳米技术
电气工程
工程类
色谱法
作者
Yuki Yoshida,D. M. Wood,Timothy A. Gessert,T. J. Coutts
摘要
Thin films of molybdenum-doped indium oxide, an n-type transparent conducting oxide, were deposited on glass substrates by a large-area deposition technique, radio-frequency magnetron sputtering, and their electrical properties were examined. Molybdenum content was varied from 1 to 4 wt%, and the highest mobility achieved was 83 cm2 V−1 s−1 at a carrier concentration of 3.0×1020 cm−3 without any postdeposition treatment for one of the films made from the target with 2 wt% Mo. Temperature-dependent Hall analysis indicated that this high mobility is limited by phonon scattering, whereas the method of four coefficients analysis showed that the conduction band is parabolic.
科研通智能强力驱动
Strongly Powered by AbleSci AI