Characterization of Titanium Silicide (TiSi[sub 2]) for Complementary Metal Oxide Semiconductor

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Yee Mon Thu, Khin Maung Latt; Characterization of Titanium Silicide (TiSi2) for Complementary Metal Oxide Semiconductor. AIP Conf. Proc. 5 January 2010; 1202 (1): 84–87. https://doi.org/10.1063/1.3295615 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search