格式化
甲酸
化学吸附
氢
X射线光电子能谱
解吸
化学
无机化学
氢溢流
吸附
离解(化学)
热脱附光谱法
催化作用
物理化学
化学工程
有机化学
工程类
作者
Audunn Ludviksson,R. Zhang,Charles T. Campbell,K. Griffiths
标识
DOI:10.1016/0039-6028(94)91157-6
摘要
The adsorption and reactions of formic acid (HCOOD : HCOOH = 3:1) on the oxygen-terminated ZnO(0001̄)-O surface and on thin Cu films deposited on the ZnO(0001̄)-O surface have been studied with temperature programmed desorption (TPD) and XPS. Small amounts of formic acid dissociate at defect sites on clean ZnO(0001̄)-O to yield surface formate (HCOO). The acid D(H) from this dissociation does not reappear in TPD, and is lost to the ZnO bulk, as confirmed by nuclear reaction analysis. The surface HCOO decomposes to yield nearly simultaneous CO2 (37%), CO (63%) and H2 TPD peaks at 560 K. Substantial amounts of D (∼ 20%) are incorporated in this hydrogen TPD peak resulting from formate decomposition at ZnO defects, indicating that bulk D is readily accessible. Submonolayer and multilayer Cu films that are deposited at 130 K and partially cover the ZnO surface as 2D and 3D islands adsorb formic acid and decompose it into formate and hydrogen much like the Cu(110) surface. The surface formate from the Cu film decomposes at 470–500 K to give primarily CO2 and H2, also much like Cu(110), although atom-thin Cu islands also give ∼ 40% CO. Annealed Cu films give formate decomposition peaks at 25–50 K lower in temperature, attributed to thickening and ordering of the Cu islands to form Cu(111)-like sites. The acid D(H) atom from the formic acid is partially lost by hydrogen spillover from the Cu islands into the ZnO substrate, especially for thin Cu films. This effect partially desorbs and is enhanced upon preannealing the Cu layers, due to increased H diffusion rates across the annealed Cu islands, and/or the decrease in island size. Bulk D(H) is slowly removed as D2, HD and H2 above 400 K in diffusion-limited desorption, catalyzed by Cu.
科研通智能强力驱动
Strongly Powered by AbleSci AI