干涉测量
光学
干扰(通信)
材料科学
隐形眼镜
镜头(地质)
光路长度
波长
计算机科学
物理
频道(广播)
计算机网络
作者
P. Ewen King‐Smith,Barbara A. Fink,Nick Fogt
标识
DOI:10.1097/00006324-199901000-00025
摘要
The thickness of different layers of the tear film has been measured by three types of interference method, namely, wavelength-dependent fringes (VVDFs), thickness-dependent fringes (TDFs), and angle-dependent fringes (ADFs). This review begins with a discussion of characteristics which are common to all these methods—high-, intermediate-, and low-index layers, phase, optical path difference, and contrast. For each of the three methods, we present a figure showing constructive and destructive interference, derive equations for calculating tear layer thickness, describe a typical optical system, and show representative results. The particular advantages and limitations of each method are discussed. Given the clinical importance of the tear film in dry eye syndrome and contact lens wear, it is unfortunate that there are considerable discrepancies among the results of interferometric and other methods for measuring tear film thickness; further development of these noninvasive, interferometric methods should help to provide a clearer picture of the thickness of different layers of the tear film, in normal and dry eyes, and in contact lens wear.
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