材料科学
光学
硅
太阳能电池
光线追踪(物理)
光电子学
涂层
计算
菲涅耳方程
纹理(宇宙学)
光伏系统
解耦(概率)
防反射涂料
计算机科学
物理
图像(数学)
折射率
工程类
复合材料
人工智能
电气工程
控制工程
算法
作者
Keith R. McIntosh,Simeon C. Baker‐Finch
标识
DOI:10.1109/pvsc.2012.6317616
摘要
The freeware program OPAL 2 computes the optical losses associated with the front surface of a Si solar cell. It calculates the losses for any angle of incidence within seconds, where the short computation time is achieved by decoupling the ray tracing from the Fresnel equations. Amongst other morphologies, OPAL 2 can be used to assess the random-pyramid texture of c-Si solar cells, or the `isotexture' of mc-Si solar cells, and to determine (i) the optimal thickness of an antireflection coating with or without encapsulation, (ii) the impact of imperfect texturing, such as non-ideal texture angles, over-etched isotexture, and flat regions, and (iii) the subsequent 1D generation profile in the Si. This paper describes the approach and assumptions employed by OPAL 2 and presents examples that demonstrate the dependence of optical losses on texture quality and incident angle.
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