云母
扫描力显微镜
原子力显微镜
纳米技术
显微镜
导电原子力显微镜
分辨率(逻辑)
材料科学
DNA
扫描探针显微镜
化学
结晶学
光学
物理
复合材料
计算机科学
生物化学
人工智能
作者
Yuri L. Lyubchenko,Alexander Gall,Luda S. Shlyakhtenko
出处
期刊:Humana Press eBooks
[Humana Press]
日期:2003-11-15
卷期号:: 569-578
被引量:19
标识
DOI:10.1385/1-59259-208-2:569
摘要
Atomic force microscopy (AFM; also called scanning force microscopy [SFM]) is a rather novel technique that offers unique advantages in the potential for the very high resolution of DNA and small ligands in the absence of stains, shadows, and labels (,). Furthermore, the scanning can be performed in air or liquid. The latter is particularly important for resolving fully hydrated structures. The AFM is theoretically capable of resolving structural details at the level of atomic dimensions, provided that the specimen is not dynamic.
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