光伏系统
计算机科学
棱锥(几何)
特征(语言学)
人工智能
电致发光
特征提取
卷积(计算机科学)
模式识别(心理学)
领域(数学)
算法
电子工程
人工神经网络
材料科学
电气工程
纳米技术
图层(电子)
光学
哲学
工程类
物理
纯数学
语言学
数学
作者
Yukang Cao,Dandan Pang,Qianchuan Zhao,Yi Yan,Yongqing Jiang,Chongyi Tian,Fan Wang,Julin Li
标识
DOI:10.1016/j.engappai.2024.107866
摘要
Photovoltaic defect detection is an essential aspect of research on building-distributed photovoltaic systems. Existing photovoltaic defect detection models based on deep learning, such as YOLOv5 and YOLOv8, have significantly improved the accuracy of photovoltaic defect detection. However, these models are too large, and their feature extraction ability is insufficient, leading to low detection efficiency and inability to cope with the continuous evolution of defects. Therefore, this study proposes an accurate and lightweight YOLOv8 (You Only Look Once v8) GD algorithm. The algorithm is an improved version of YOLOv8, wherein DW-Conv (DepthWise-Conv) is applied to the YOLOv8 backbone network. Moreover, convolution is replaced with the GSConv (Group-shuffle Conv) and the BiFPN (bidirectional feature pyramid network) structure is added to the architecture. Several electroluminescent photovoltaic defect datasets are used to verify the effectiveness of the proposed method. The final experimental results show that the [email protected] and [email protected]∼0.95 of YOLOv8-GD are 92.8% and 63.1%, respectively, which are 4.2% and 5.7% higher than those of the original algorithm, respectively, and the model volume is reduced by 16.7%. Thus, the proposed algorithm shows considerable potential in the field of photovoltaic defect detection.
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