光电探测器
暗电流
超晶格
光电子学
材料科学
红外线的
探测器
响应度
电容
偏压
红外探测器
饱和电流
电压
光学
物理
电极
量子力学
作者
Ruoyu Xie,Nong Li,Yifan Shan,Xiangbin Su,Wu‐Xing Zhou,Faran Chang,Yan Liang,Dongwei Jiang,Guowei Wang,Hongyue Hao,Yingqiang Xu,Donghai Wu,Zhichuan Niu
标识
DOI:10.1016/j.infrared.2023.105074
摘要
This study investigates the performance of infrared photodetectors through variable temperature tests, specifically examining dark current, light current, and capacitance. The reduction of dark current and the increase in carrier lifetimes are crucial for enabling the utilization of infrared photodetectors in complex environments. By conducting tests and analyses on high-performance detectors, the physical mechanisms governing carrier transport processes can be obtained. In order to elucidate the characteristics of InAs/GaSb/AlSb type-II superlattices, a short-wave infrared (SWIR) photodetector exhibiting low dark current and low saturation bias voltage is designed and fabricated.
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