神经形态工程学
油藏计算
卷积神经网络
材料科学
锡
MNIST数据库
计算机科学
电阻随机存取存储器
光电子学
CMOS芯片
电阻式触摸屏
记忆电阻器
电压
人工神经网络
电子工程
电气工程
人工智能
循环神经网络
工程类
计算机视觉
冶金
作者
Jongmin Park,Tae‐Hyeon Kim,Osung Kwon,Muhammad Ismail,Chandreswar Mahata,Yoon Kim,Sang‐Bum Kim,Sungjun Kim
出处
期刊:Nano Energy
[Elsevier]
日期:2022-10-14
卷期号:104: 107886-107886
被引量:46
标识
DOI:10.1016/j.nanoen.2022.107886
摘要
We developed W/HfO 2 /TiN vertical resistive random-access memory (VRRAM) for neuromorphic computing. First, basic electrical properties, such as current–voltage curves, retention, and endurance, were determined. To examine the conduction mechanism, a device with a large switching area was fabricated, and its current level and that of the VRRAM were compared. Moreover, we analyzed the current behavior relative to the ambient temperature. Subsequently, the number of states upon potentiation and depression was linearly converted via conductance modulation due to an applied pulse. The practicality of the device was assessed using a convolutional neural network. Finally, 16-state reservoir computing was combined with multilevel characteristics to implement 8-bit reservoir computing with 256 states. We verified that in terms of time and power consumption, 8-bit reservoir computing is more efficient than 4-bit reservoir computing. Hence, we concluded that the W/HfO 2 /TiN VRRAM cell is a promising volatile memory device. • 3-dimensional VRRAM structure was fabricated for high-density synapse • High-performance memory with low-power and self-rectifying characteristics is implemented • 99.15% accuracy for MNIST is achieved in CNN • Short-term memory characteristics are demonstrated • Reservoir computing with 256 states was demonstrated for more energy efficiency
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