钙钛矿(结构)
卤化物
材料科学
光电子学
化学工程
无机化学
化学
工程类
作者
Jidong Deng,Kun Wei,Yang Li,Lin Lü,Yuan‐Hui Xiao,Xuanyi Cai,Cuiping Zhang,De‐Yin Wu,Xiaoli Zhang,Jinbao Zhang
标识
DOI:10.1002/adma.202300233
摘要
defects and perovskite cations, leading to retarded perovskite crystallization and high-quality perovskite films with reduced residual stress. These improved properties enable champion efficiencies of 24.2% (the control: 20.5%) and 22.1% (the control: 18.7%) in rigid and flexible devices with extremely low voltage deficit down to 386 mV, all of which are among the highest reported values for PSCs with a similar device architecture. In addition, the resulting devices exhibit marked improvements in the device longevity under various stressors of humidity (>5000 h), light (1000 h), heat (180 h), and bending test (10 000 times). This method provides an effective way to improve the quality of buried interfaces toward high-performance PSCs.
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