物理
量具(枪械)
光学
干涉测量
距离测量
跟踪(教育)
激光器
半导体
计算机科学
光电子学
心理学
教育学
历史
人工智能
考古
作者
Daniel M. Kaplan,Thomas J. Roberts,James D. Phillips,R. D. Reasenberg
标识
DOI:10.1088/1748-0221/13/03/p03008
摘要
We describe new results from the semiconductor-laser tracking frequency gauge, an instrument that can perform sub-picometer distance measurements and has applications in gravity research and in space-based astronomical instruments proposed for the study of light from extrasolar planets. Compared with previous results, we have improved incremental distance accuracy by a factor of two, to 0.9 pm in 80 s averaging time, and absolute distance accuracy by a factor of 20, to 0.17 $\mu$m in 1000 s. After an interruption of operation of a tracking frequency gauge used to control a distance, it is now possible, using a nonresonant measurement interferometer, to restore the distance to picometer accuracy by combining absolute and incremental distance measurements.
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