磁化
超导电性
凝聚态物理
缩放比例
临界电流
材料科学
领域(数学)
表征(材料科学)
偏移量(计算机科学)
磁化率
场依赖性
直流偏压
磁场
物理
纳米技术
电压
计算机科学
量子力学
程序设计语言
纯数学
数学
几何学
标识
DOI:10.1088/0953-2048/5/1s/092
摘要
Low field DC and AC susceptibility (swept temperature) and magnetization (swept field) are routinely used to characterize bulk samples of high Tc superconducting materials. More information can be obtained by extending these techniques, for example, by adding a DC offset field in the AC susceptibility measurements and by making magnetization measurements for several different cycles of the applied field. The relationships between the critical current and its scaling length are developed with respect to these experimental techniques.
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