X射线光电子能谱
材料科学
云母
剥脱关节
透射电子显微镜
拉曼光谱
分析化学(期刊)
扫描电子显微镜
图层(电子)
化学工程
纳米技术
复合材料
石墨烯
光学
化学
有机化学
物理
工程类
作者
Tran Van Khai,Han Gil Na,Dong Sub Kwak,Yong Jung Kwon,Heon Ham,Kwang Bo Shim,Hyoun Woo Kim
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2013-03-18
卷期号:24 (14): 145602-145602
被引量:32
标识
DOI:10.1088/0957-4484/24/14/145602
摘要
We have successfully fabricated single- and few-layer mica nanosheets, by means of using a solvothermal method in conjunction with a microwave irradiated expansion process. In the solvothermal process, dissolved potassium ions were intercalated onto the interlayer space of the mica. Following this, microwave irradiation facilitates the exfoliation of individual nanosheets. The synthesized products were characterized by field emission scanning electron microscopy, transmission electron microscopy (TEM), atomic force microscopy (AFM), x-ray diffraction, x-ray photoelectron spectroscopy (XPS), and Raman spectroscopy measurements. AFM and TEM studies claimed the existence of single-layer mica. High-resolution TEM (HR-TEM) investigations revealed that the exfoliated product corresponded to a crystalline mica structure, being comprised of Si, Al, O, and K elements. XPS spectra exhibited the major constituent peaks, including O 1s, Si 2p, Al 2p, and K 2p. In addition, C atomic concentration has been slightly increased by the contamination during exfoliation, presumably due to the increase of the exposed mica surface. The C 1s XPS spectra revealed that the C–C bonding in organic surface contaminants was broken, whereas the Si–C bonding was enhanced, by the exfoliation process. The O 1s XPS spectra revealed that the Si–O bonding in mica was broken, generating the O–Si–C bonding. This study paves the way towards the fabrication of single- or few-layer inorganic nanosheets of desired materials, via a convenient and efficient route.
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