同步加速器
光学
分辨率(逻辑)
衰减
X射线显微断层摄影术
材料科学
断层重建
探测器
图像分辨率
断层摄影术
X射线
衰减系数
同步辐射
千分尺
X射线探测器
物理
计算机科学
人工智能
作者
Brian P. Flannery,H. W. Deckman,W. G. Roberge,K. L. D’Amico
出处
期刊:Science
[American Association for the Advancement of Science (AAAS)]
日期:1987-09-18
卷期号:237 (4821): 1439-1444
被引量:703
标识
DOI:10.1126/science.237.4821.1439
摘要
The new technique of x-ray microtomography nondestructively generates three-dimensional maps of the x-ray attenuation coefficient inside small samples with approximately 1 percent accuracy and with resolution approaching 1 micrometer. Spatially resolved elemental maps can be produced with synchrotron x-ray sources by scanning samples at energies just above and below characteristic atomic absorption edges. The system consists of a high-resolution imaging x-ray detector and high-speed algorithms for tomographic image reconstruction. The design and operation of the microtomography device are described, and tomographic images that illustrate its performance with both synchrotron and laboratory x-ray sources are presented.
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