光电探测器
材料科学
光电子学
响应度
超短脉冲
异质结
纳米棒
光学
激光器
纳米技术
物理
作者
Jixing Chai,Qianhu Liu,Liang Chen,Ben Cao,Deqi Kong,Tingjun Lin,Wenliang Wang,Guoqiang Li
标识
DOI:10.1002/aelm.202201193
摘要
Abstract Due to wavelength‐selective characteristics, the InGaN‐based photodetectors show bright prospects in visible light communication and fast imaging system. However, the application of InGaN photodetectors with simple structures is limited in the above field owing to the slow response speed. Herein, an ultrafast photodetector based on axial InN/InGaN nanorod array (NRA) heterojunction is prepared through a self‐catalytic high (930 °C) and low (400 °C) temperature two‐step growth method by molecular beam epitaxy (MBE). The performance of photodetectors is analyzed by semiconductor device analyzer, wavelength response system (consists with a xenon lamp and monochromator), and time response system (combined by an optical chopper, a laser, and a digital oscilloscope). The photodetectors present a fast response speed with a rise/full time of 18.2/24.7 µs. Further analyses reveal a responsivity of 9.27 A W −1 and a specific detectivity of 3.54 × 10 10 Jones under −1 V bias. As a result, the axial NRA heterojunction photodetectors exhibit great potential for application in ultrafast photoelectric conversion systems and provide valuable guidance for realizing ultrafast photodetectors.
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