Comparative Analysis of Phase Leg Voltage Drop Characteristics according to GaN HEMT Type in Short Circuit Condition
高电子迁移率晶体管
材料科学
电压降
短路
电压
电气工程
下降(电信)
光电子学
工程类
晶体管
作者
Hyunsoo Yoon,Cheol-Min Kim,Yan-Rong Li,Nam-Joon Kim
出处
期刊:The Transactions of the Korean Institute of Electrical Engineers [The Korean Institute of Electrical Engineers] 日期:2024-01-23卷期号:73 (1): 50-55
标识
DOI:10.5370/kiee.2024.73.1.50
摘要
This paper compares and analyzes the voltage drop characteristics that occur in the event of a short circuit depending on the type of GaN HEMT power semiconductor with a phase leg voltage detection method. E-mode GaN HEMT and Cascode GaN HEMT are used as comparative samples, and characteristics are compared through LTspice simulation and experimentation. The analysis confirms that E-mode GaN HEMT results in a larger phase leg voltage drop, and demonstrates that the type of GaN HEMT power semiconductor should be considered when designing a short-circuit detection system with a phase leg voltage detection method.