电子晶体学
仪表(计算机编程)
化学
电子衍射
纳米技术
衍射
电子
领域(数学)
电子显微镜
结晶学
工程物理
计算机科学
光学
物理
材料科学
量子力学
操作系统
数学
纯数学
作者
Tim Gruene,Enrico Mugnaioli
出处
期刊:Chemical Reviews
[American Chemical Society]
日期:2021-09-17
卷期号:121 (19): 11823-11834
被引量:51
标识
DOI:10.1021/acs.chemrev.1c00207
摘要
In the past few years, many exciting papers reported results based on crystal structure determination by electron diffraction. The aim of this review is to provide general and practical information to structural chemists interested in stepping into this emerging field. We discuss technical characteristics of electron microscopes for research units that would like to acquire their own instrumentation, as well as those practical aspects that appear different between X-ray and electron crystallography. We also include a discussion about applications where electron crystallography provides information that is different, and possibly complementary, with respect to what is available from X-ray crystallography.
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