光学
透射率
Z扫描技术
折射率
折射
失真(音乐)
非线性系统
物理
激光器
波前
高斯光束
梁(结构)
衰减系数
材料科学
非线性光学
光电子学
放大器
CMOS芯片
量子力学
作者
Mansoor Sheik‐Bahae,A. A. Said,Tai‐Huei Wei,David J. Hagan,Eric W. Van Stryland
摘要
A sensitive single-beam technique for measuring both the nonlinear refractive index and nonlinear absorption coefficient for a wide variety of materials is reported. The authors describe the experimental details and present a comprehensive theoretical analysis including cases where nonlinear refraction is accompanied by nonlinear absorption. In these experiments, the transmittance of a sample is measured through a finite aperture in the far field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinear refraction are easily deduced from such a transmittance curve (Z-scan). Employing this technique, a sensitivity of better than lambda /300 wavefront distortion is achieved in n/sub 2/ measurements of BaF/sub 2/ using picosecond frequency-doubled Nd:YAG laser pulses.< >
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