可靠性工程
可靠性(半导体)
计算机科学
法律工程学
出处
期刊:Elsevier eBooks
[Elsevier]
日期:2015-01-01
被引量:262
标识
DOI:10.1016/c2009-0-05748-1
摘要
An Overview of Electronic Devices and Their Reliability. Electronic Devices: How They Operate and Are Fabricated. Defects, Contaminants, and Yield. The Mathematics of Failure and Reliability. Mass Transport-Induced Failure. Electronic Charge-Induced Damage. Environmental Damage to Electronic Products. Packaging Materials, Processes and Stresses. Degradation of Contacts and Package Interconnections. Degradation and Failure of Electro-Optical Materials and Devices. Characterization and Failure Analysis of Materials and Devices. Future Directions and Reliability Issues.
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