计量学
计算机科学
结构光三维扫描仪
干涉测量
振动
结构光
机械工程
光学
工程类
计算机视觉
声学
人工智能
物理
扫描仪
作者
Joanna Schmit,Erik Novak,Shawn McDermed
摘要
Measuring scratches, nicks and dents on precision machine parts is a challenge for industry, especially when the parts have to be tested on the factory floor or in the field, far from any metrology laboratory. A new system that combines dynamic interferometry with structured light enables the projection and analysis of polarization-based virtual fringes in a single camera frame. This very compact system, the metrology setup is flashlight-sized, is capable of micrometer precision, yet is immune to vibration, which enables handheld operation in a variety of environments. This paper will discuss the technical approach to achieve vibration-immune 3D measurements and will present a variety of performance tests and a discussion of practical applications of the system.
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