无定形固体
四面体
材料科学
Atom(片上系统)
石英
硅
结晶学
非晶硅
无定形二氧化硅
晶体硅
光电子学
化学工程
化学
冶金
嵌入式系统
工程类
计算机科学
标识
DOI:10.1016/s0022-3697(71)80159-2
摘要
Optical data for non-crystalline Si, SiO, SiOx(x=1·5) and SiO2 are presented and analyzed for the energy region 1 to 26 eV. The results indicate that amorphous substances of all intermediate compositions between Si and SiO2 can be formed and that these materials are not simple mixtures of Si and SiO2 but rather the two atom species are blended on an atomic scale. More specifically, the Si bonding is tetrahedral (perhaps highly distorted) and of the type Si−(SivO4−v) where the distribution of atoms is essentially statistical. Further it is found that the optical properties of these layers are determined by the presence and grouping of Si−O and Si−Si bonds and that clusters of like bonds of the dimension of a Si−(Si4) or Si−(O4) tetrahedra have optical properties comparable to those exhibited by amorphous silicon or quartz, respectively, ‘in bulk’.
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