材料科学
悬臂梁
灵敏度(控制系统)
偏转(物理)
固有频率
硅
光电子学
微观结构
500千赫
微电子机械系统
声学
光学
电子工程
复合材料
物理
振动
工程类
作者
Frédéric Lochon,Isabelle Dufour,Dominique Rebière
标识
DOI:10.1016/j.snb.2004.11.086
摘要
By measuring shifts in the resonant frequency of a silicon microcantilever coated with a sensitive layer, it is possible to obtain a competitive chemical microsensor. In fact, the sensitivity of such a microsensor is improved when used in high resonant frequency device. Usually, to increase the resonant frequency, smaller microcantilevers are used. The limitation on increasing the natural frequency by reducing the microstructure size is often due to the limitation of the deflection measurement principle. Furthermore, it could also be difficult to obtain reproducible sensitive coatings on very small surfaces. In order to achieve high sensitivities corresponding to high frequencies without decreasing the microstructure size, high-order flexural modes can be considered. In this paper, it is demonstrated that the theoretical performance of the resonant microcantilever chemical sensor is essentially due to the resonant frequency value and not due to the mode order. The advantages of increasing the resonant frequency by using high-order modes is also confirmed experimentally.
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