Deep learning based metamaterial assisted illumination nanoscopy

The blind-SIM algorithm reconstructs super-resolution images using random illumination patterns. Recently, Speckle-MAIN has shown that this algorithm, when combined with high resolution near-field illumination patterns, can extend SIM resolution down to 40nm. However, the use of the iterative blind-SIM algorithm is computationally expensive, time-consuming and is prone to artifacts. We demonstrate that using a deep neural network we can achieve similar or better reconstruction results compared to blind-SIM with fewer artifacts and orders of magnitude better reconstruction time. This work makes real-time Speckle-MAIN super resolution imaging possible.