离子束
材料科学
曲面(拓扑)
原子物理学
能量(信号处理)
光学
梁(结构)
溅射
物理
作者
Frank Frost,Renate Fechner,B. Ziberi,Dieter Flamm,A. Schindler
标识
DOI:10.1016/j.tsf.2003.12.107
摘要
Abstract This contribution focuses on ion beam-assisted processes targeted at the preparation of ultra-smooth surfaces with root mean square (rms) roughness values Rq 0.1 μm−1). These smoothing techniques were discussed for common optical substrate materials like silicon, quartz glass and a special glass ceramic. By optimization and combination of these different techniques a sub-nanometer scale roughness reduction down to 0.1 nm was demonstrated. Due to the application of broad beam ion sources the results are also applicable to large-scale optical components.
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