蚀刻(微加工)
材料科学
光学
表征(材料科学)
激光器
纳米技术
物理
图层(电子)
作者
Jérôme Néauport,Chrystel Ambard,Philippe Cormont,N. Darbois,J. Destribats,Clément Luitot,Olivier Rondeau
出处
期刊:Optics Express
[The Optical Society]
日期:2009-10-23
卷期号:17 (22): 20448-20448
被引量:87
摘要
Detection and measurement of subsurface damage of ground optical surfaces are of major concern in the assessment of high damage thresholds fused silica optics for high power laser applications.We herein detail a new principle of SSD measurement based on the utilization of HF acid etching.We also review and compare different subsurface damage (SSD) characterization techniques applied to ground and fine ground fused silica samples.We demonstrate good concordance between the different measurements.
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