透射电子显微镜
金属间化合物
退火(玻璃)
材料科学
薄膜
锡
电子显微镜
纹理(宇宙学)
结晶学
分析化学(期刊)
冶金
纳米技术
化学
光学
合金
图像(数学)
物理
色谱法
人工智能
计算机科学
作者
L. Buene,H. Falkenberg-Arell,J. Gjønnes,J. Taftø
标识
DOI:10.1016/0040-6090(80)90258-8
摘要
Transmission electron microscopy was used to investigate the Au-Sn thin film system. Evaporated films with total thickness ranging from about 300 to about 1000 Å and with composition ranging from 5 to 90at.% Sn were studied with respect to intermetallic compound phases, texture and microscopic structure. It was found that the unannealed films contained one or more of the phases AuSn, AuSn2 and AuSn4, depending on the overall composition. The texture and structure of the films were dependent on the order of evaporation as well as the composition. In many cases a considerable grain growth took place during annealing.
科研通智能强力驱动
Strongly Powered by AbleSci AI