衍射
衍射仪
材料科学
X射线晶体学
纹理(宇宙学)
探测器
光学
X射线
结晶学
物理
计算机科学
图像(数学)
复合材料
人工智能
化学
扫描电子显微镜
作者
Bob B. He,U. Preckwinkel,Kingsley L. Smith
出处
期刊:Materials Science Forum
日期:2002-08-07
卷期号:404-407: 109-114
被引量:4
标识
DOI:10.4028/www.scientific.net/msf.404-407.109
摘要
Two-dimensional x-ray diffraction (XRD 2 ) refers to x-ray diffraction applications with two-dimensional (2D) detector and corresponding data reduction and analysis. The two-dimensional diffraction pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer. In order to take the advantages of the 2D detector, new approaches are necessary to configure the two-dimensional x-ray diffraction system and to analyze the 2D diffraction data. The present paper is an introduction to some fundamentals about stress and texture analysis with two-dimensional x-ray diffraction using the Bruker GADDS system as an example.
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