声子
热导率
拉曼光谱
材料科学
凝聚态物理
热的
异质结
模式(计算机接口)
平面(几何)
化学物理
光学
光电子学
化学
物理
热力学
复合材料
几何学
计算机科学
数学
操作系统
作者
Dongsheng Li,Xiaona Huang,Zeyu Liu,Wenxiang Liu,Shen Xu,Yanan Yue
摘要
Thermal transport within nanostructures is highly confined by interfaces, and non-trivial physics can emerge at boundaries. Theoretical studies have shown that different phonon modes can exhibit varying thermal resistances at interfaces. Experimental observation of these variations, however, is lacking. Using the steady-state Raman thermometry, the E2g1 and A1g vibrational modes of MoS2 were utilized to characterize the thermal transport properties across the MoS2/Si interface. Our results revealed distinct temperature rises associated with different modes, indicating various mode contributions in the interfacial thermal conductance. Combining experimental and numerical simulations, the out-of-plane mode in MoS2 was found to contribute less to the interfacial transport, by 21.5%, attributed to the less variational mode mismatch of the in-plane phonon, compared to the in-plane mode. Furthermore, our results confirmed a 26.9% higher thermal conductivity from the out-of-plane mode than the in-plane one.
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