跨导
晶体管
场效应晶体管
拓扑(电路)
物理
电气工程
光电子学
材料科学
量子力学
工程类
电压
作者
Kai Zhang,Sina Li,Jianru Chen,Lingyu Zhu,Yiming Sun,Jingbo Li,Nengjie Huo
标识
DOI:10.1109/ted.2023.3266309
摘要
In the applications of low-power device design and large-scale integrated circuit, MOSFETs play an important role but suffer from the doping complexity and short channel effect when the technology node is further shrinking. Thus, it is of great interest to develop new transistor architecture with atomically thin channel materials to meet the demand for high-density integration and low-power consumption electronics. Here, we develop a dual-junctions field-effect transistor (DJFET) consisting of van der Waals MoS2/Te/MoS2 heterojunctions where the MoS2 on top and bottom serves as dual-gate and the tellurium (Te) in middle is the carrier transport channel. The novel transistor exhibits superior transfer and output characteristics with p-type behavior, high mobility of 270.3 cm $^{{2}}\text{V}^{-{1}}\text{s}^{-{1}}$ and large transconductance of $16.4~\mu \text{S}$ , competing with widely-reported MOSFETs based on 2-D semiconductors. Additionally, the devices can be operated as a self-driven photodetector with a high responsivity of 879.2 mAW $^{-{1}}$ and a specific detectivity of $3.47\times 10^{{11}}$ Jones. This work proposes a new dual-junctions transistor as a highly desirable candidate for next-generation electronic applications.
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