An Explanation for High Defect Tolerance in Metal Halide Perovskite Quantum Dots

We propose Auger-like process assisted by quantum defects in metal halide perovskite quantum dots, where a charge carrier in the ground state of the quantum dot is trapped by quantum defects, resulting in another charge carrier in defect is excited and returns back to the ground state of the quantum dot. We find that the whole process is on the femtosecond scale. More importantly, the process is independent of the depth and species of the defects, which is in good agreement with the recent theoretical prediction using ab initio nonadiabatic molecular dynamics simulation. This Auger-like process may provide a potential explanation of high defect tolerance in metal halide perovskite materials.