薄膜
氧化铟锡
材料科学
带隙
无定形固体
微晶
铟
透明导电膜
分压
光电子学
锡
氧化物
分析化学(期刊)
氧气
纳米技术
化学
结晶学
冶金
有机化学
色谱法
作者
Jiwoong Kim,Sujan Shrestha,Maryam Souri,John Connell,Sungkyun Park,S. S. A. Seo
标识
DOI:10.1038/s41598-020-69463-4
摘要
Abstract Indium tin oxide (ITO) is one of the most widely used transparent conductors in optoelectronic device applications. We investigated the optical properties of ITO thin films at high temperatures up to 800 °C using spectroscopic ellipsometry. As temperature increases, amorphous ITO thin films undergo a phase transition at ~ 200 °C and develop polycrystalline phases with increased optical gap energies. The optical gap energies of both polycrystalline and epitaxial ITO thin films decrease with increasing temperature due to electron–phonon interactions. Depending on the background oxygen partial pressure, however, we observed that the optical gap energies exhibit reversible changes, implying that the oxidation and reduction processes occur vigorously due to the low oxidation and reduction potential energies of the ITO thin films at high temperatures. This result suggests that the electronic structure of ITO thin films strongly depends on temperature and oxygen partial pressure while they remain optically transparent, i.e., optical gap energies > 3.6 eV.
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