印刷电路板
数码产品
下降(电信)
触电
加速度
休克(循环)
电气工程
材料科学
电容器
光学
声学
工程类
物理
电压
内科学
经典力学
医学
作者
Pradeep Lall,Aathi Raja Ram Pandurangan,Venkata Kalyan Reddy Dornala,Jeff Suhling,John Deep,Ryan Lowe
标识
DOI:10.1115/ipack2019-6575
摘要
Abstract Defense and Aerospace applications increasingly rely on commercial off-the shelf electronics. Electronics in defense applications may be exposed to harsh environments including high-g acceleration loads. The horizontal board configuration is most frequently tested. However, other shock orientations may be more damaging depending on technology and design. The out-of-plane displacement and strain values highly depend on the angle of shock on the electronic components in the printed circuit board. The effect of variation in drop angle under high G conditions, and efficacy of supplemental restraint mechanisms on the reliability have not been studied at high-g acceleration loads in the range of 10,000g–50,000g. In this study the reliability of fine-pitch electronics and large 3640 capacitors with C0G dielectric has been studied in presence of potting compounds, different shock orientations. A circular printed circuit board has been designed with daisy-chained packages. The drop angle has been varied from zero-degree to 30-degree. A drop-tower with dual mass shock amplifier has been used to achieve the desired acceleration pulse. Transient dynamic deformation has been measured using high-speed imaging in conjunction with digital image correlation.
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