电阻随机存取存储器
材料科学
石墨烯
光电子学
氧化锡
兴奋剂
纳米技术
氧化物
锡
双层
电阻式触摸屏
图层(电子)
切换时间
电压
电气工程
化学
膜
生物化学
工程类
冶金
作者
Anil Lodhi,Shalu Saini,Anurag Dwivedi,Arpit Khandelwal,Shree Prakash Tiwari
标识
DOI:10.1088/1361-6439/ac521f
摘要
Abstract In this paper, firstly, some recently explored promising materials and processes for resistive random access memory (ReRAM) devices with bipolar switching mechanism along with their performance are discussed. Further, resistive switching behaviour of TiO x /graphene oxide (GO):poly(4-vinylphenol) (PVP) based bilayer in ReRAM devices is demonstrated. It was found that bipolar resistive switching behaviour is significantly enhanced by embedding 2D material such as GO in the organic polymer acting as switching layer. ReRAM devices with Ag/PVP:GO/TiO x /fluorine doped tin oxide (FTO) structure exhibited high ON/OFF current ratio (>10 3 ), low voltage operation, and high retention time. Bipolar resistive switching from these engineered active layers will have great potential for future large area and sustainable electronics.
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