极紫外光刻
覆盖
计算机科学
多重图案
可靠性(半导体)
体积热力学
扫描仪
临界尺寸
可靠性工程
控制逻辑
节点(物理)
材料科学
嵌入式系统
计算机硬件
工程类
纳米技术
操作系统
人工智能
功率(物理)
物理
结构工程
图层(电子)
量子力学
抵抗
光学
作者
Christophe Smeets,Roderik van Es,Roelof de Graaf,Leon Levasier,Marcel Mastenbroek,Eric Verhoeven
摘要
ASML NXE:3400 scanners are now commonly used for High Volume Manufacturing (HVM) of 7nm and 5nm logic devices as well as D1z memory devices. This year, ASML has introduced the NXE:3600D scanner to the market, targeting 3nm logic and D1a and D1b nodes. In this paper we will share the latest performance of these systems, including excellent overlay, critical dimension (CD) control, stability, reliability, and high productivity. Furthermore, we will address the ASML roadmap for meeting the requirements for the 2 nm node and beyond.
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