静电放电
计算机科学
香料
电子工程
半导体器件建模
建模与仿真
集成电路
工程类
作者
Jie Xiong,Zaichen Chen,Yang Xiu,Zhen Mu,Maxim Raginsky,Elyse Rosenbaum
出处
期刊:Electrical Overstress/Electrostatic Discharge Symposium
日期:2018-10-25
被引量:4
标识
DOI:10.23919/eos/esd.2018.8509751
摘要
To enable accurate system-level ESD simulation, the quasi-static I-V model of an IC is enhanced through kernel regression to reflect its circuit board dependency; alternatively, a recurrent neural network may be used to generate a non-quasi-static transient model. Hybrid electromagnetic and circuit simulation is demonstrated for ESD-induced noise coupling analysis.
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