薄膜
材料科学
电化学
肖特基二极管
结晶
纳米技术
泄漏(经济)
杂质
化学工程
空间电荷
聚合物
普尔-弗伦克尔效应
光电子学
电极
复合材料
化学
物理化学
有机化学
经济
电子
量子力学
宏观经济学
工程类
物理
二极管
出处
期刊:Chemical Industry and Engineering Progress
日期:2013-01-01
摘要
Research on formation mechanisms of electrochemical Ta2O5 thin films is reviewed.The emphasis is on the mechanism of leakage current in response to light for electrochemical Ta2O5 thin films.The influence factors for the formation of Ta2O5thin films,including oxygen content,impurities and crystallization are described.The mechanisms of leakage current,such as the Fowler-Nordheim(F-N) conductive mechanism,space charge limited current(SCLC),Pool-Frenkel(PF) emission and Schottky(S) emission are outlined.The theory and technology for decreasing leakage current Ta2O5 thin films are prospected.New technology applications,including Ta2O5thin film heat treatment,high polymer enhanced plastic and composite thin film are expected.
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