PMOS逻辑
NMOS逻辑
充电泵
电荷(物理)
CMOS芯片
材料科学
电气工程
光电子学
电压
计算机科学
晶体管
物理
电容器
工程类
量子力学
作者
Jihoon Park,Joung-Yeal Kim,Bai‐Sun Kong,Young-Hyun Jun
出处
期刊:Journal of the Institute of Electronics Engineers of Korea
日期:2008-01-01
卷期号:45 (4): 137-145
摘要
In this paper, novel CMOS charge pump having NMOS and PMOS transfer switches and a bulk-pumping circuit has been proposed. The NMOS and PMOS transfer switches allow the charge pump to improve the current-driving capability at the output. The bulk-pumping circuit effectively solves the bulk forward problem of the charge pump. To verify the effectiveness, the proposed charge pump was designed using a 80-nm CMOS process. The comparison results indicate that the proposed charge pump enhances the current-driving capability by more than 47% with pumping speed improved by 9%, as compared to conventional charge pumps having either NMOS or PMOS transfer switch. They also indicate that the charge pump reduces the worst-case forward bias of p-type bulk by more than 24%, effectively solving the forward current problem.
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