Nonlinear charge transport induced by gate voltage oscillation in few-layer MnBi2Te4

Nonlinear charge transport, including nonreciprocal longitudinal resistance and nonlinear Hall effect, has garnered significant attention due to its ability to explore inherent symmetries and topological properties of novel materials. An exciting recent progress along this direction is the discovery of significant nonreciprocal longitudinal resistance and nonlinear Hall effect in the intrinsic magnetic topological insulator MnBi2Te4 induced by the quantum metric dipole. Given the importance of this finding, the inconsistent response with charge density, and conflicting requirement of C3z symmetry, it is imperative to elucidate every detail that may impact the nonlinear transport measurement. In this study, we reveal an intriguing experimental factor that inevitably gives rise to sizable nonlinear transport signal in MnBi2Te4. We demonstrate that this effect stems from the gate voltage oscillation caused by the application of a large alternating current to the sample. Furthermore, we propose a methodology to significantly suppress this effect by individually grounding the voltage electrodes during the second-harmonic measurements. Our investigation emphasizes the critical importance of thoroughly assessing the impact of gate voltage oscillation before determining the intrinsic nature of nonlinear transport in all 2D material devices with an electrically connected operative gate electrode.