钝化
材料科学
异质结
X射线光电子能谱
光电子学
能量转换效率
薄膜
空位缺陷
图层(电子)
纳米技术
化学工程
化学
结晶学
工程类
作者
Yoon-Chae Jung,Young-Jin Yu,Yu‐Kyung Kim,Jin Hee Lee,Jung Hwa Seo,Jea‐Young Choi
出处
期刊:Materials
[MDPI AG]
日期:2023-08-09
卷期号:16 (16): 5550-5550
摘要
In this study, we fabricated Si-based heterojunction solar cells (HSCs) with an asymmetric TMO–metal–TMO (TMT) structure using both MoO3 and V2O5 as the hole-selective contacts. Our HSCs offer enhanced long-term stability and effective passivation for crystal defects on the Si sur-face. We analyzed the oxygen vacancy state and surface morphology of the MoO3- and V2O5-TMO thin films using X-ray photoelectron spectroscopy and atomic force microscopy to investigate their passivation characteristics for Si surface defects. From the measured minority carrier lifetime, V2O5 revealed a highly improved lifetime (590 μs) compared to that of MoO3 (122.3 μs). In addition, we evaluated the long-term stability of each TMO thin film to improve the operation stability of the HSCs. We deposited different types of TMOs as the top- and bottom-TMO layers and assessed the effect of the thickness of each TMO layer. The fabricated asymmetric TMT/Si HSCs showed noticeable improvements in efficiency (7.57%) compared to 6.29% for the conventional symmetric structure which used the same TMO material for both the top and bottom layers. Furthermore, in terms of long-term stability, the asymmetric TMT/Si HSCs demonstrated an efficiency that was 250% higher than that of symmetric TMT/Si HSCs, as determined via power conversion efficiency degradation over 2000 h which is mainly attributed by the lower oxygen vacancy of the top-TMO, V2O5. These results suggest that the asymmetric TMT structure is a promising approach for the fabrication of low-cost and high-efficiency Si-based HSCs with enhanced long-term stability.
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