钨
氦
材料科学
辐照
通量
晶界
粒度
离子
表面粗糙度
冶金
分析化学(期刊)
复合材料
原子物理学
微观结构
化学
核物理学
物理
有机化学
色谱法
作者
Tongjun Xia,Zhenyu Jiang,Yongzhi Shi,Xinyu Ren,Wenjie Zhang,Meiqi Wang,Lisha Liang,Kaigui Zhu
出处
期刊:Physica Scripta
[IOP Publishing]
日期:2023-08-11
卷期号:98 (9): 095604-095604
被引量:2
标识
DOI:10.1088/1402-4896/acec19
摘要
Abstract The effects of grain boundaries and surface roughness on tungsten irradiated by 40 keV He ions with a flux of 1.6 × 10 17 He + /(m 2 s) to a fluence of 6.6 × 10 21 He m −2 at room temperature were investigated. It was found that rough surfaces can suppress the surface blistering on tungsten. This may be due to the grooves appeared on rough tungsten limiting crack growth, resulting in the release of helium. However, the influence of grain boundaries on denseness of blistering was not obvious except the difference in blistering cap. The number of blister with detached cap on large grain tungsten samples (LGW, with the grain size of ∼50 μ m) is more than that on small grain tungsten samples (SGW, with the grain size of ∼5 μ m). In addition, the effect of grain boundaries on helium retention in tungsten cannot be ignored. The total He release from SGW was 2.56 × 10 21 He m −2 , which was smaller than the value (4.10 × 10 21 He m −2 ) of LGW.
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