Effect of recrystallization degree on properties of passive film of super ferritic stainless steel S44660

Abstract The effect of the recrystallization degree on the properties of passive films formed in 0.1 M HNO 3 solution for super ferritic stainless steel S44660 was examined in this study. The initial specimens, in their cold-rolled state, showed a high dislocation density, as observed through electron backscatter diffraction (EBSD) experiments. Analysis of potentiodynamic polarization (PDP) curves and electrochemical impedance spectroscopy (EIS) measurements suggested that with the increase of recrystallization degree, the corrosion current density reduced and the corrosion potential increased. As revealed by Mott–Schottky analysis, the passive film showed a dual structure of n-type and p-type semiconductors, with the carrier density of the passive film decreasing as the recrystallization degree increased. X-ray photoelectron spectroscopy (XPS) provided insights into the film composition, indicating that the Fe 2 O 3 and Cr 2 O 3 content, which improved the stability of the passive film, increased with the degree of recrystallization. In summary, the increase in recrystallization degree reduced the number of defects in the microstructure, thereby creating favorable conditions for the formation of highly protective passive films. The passive film formed after complete recrystallization exhibited enhanced corrosion resistance.