材料科学
成核
锆钛酸铅
结晶
纹理(宇宙学)
四方晶系
无定形固体
薄膜
相(物质)
图层(电子)
钙钛矿(结构)
化学工程
结晶学
复合材料
矿物学
铁电性
晶体结构
电介质
纳米技术
化学
光电子学
有机化学
人工智能
工程类
计算机科学
图像(数学)
作者
Sungwook Mhin,Krishna Nittala,Clayton Cozzan,Kyeong‐Won Kim,Douglas S. Robinson,Luz M. Sanchez,Ronald G. Polcawich,Jacob L. Jones
摘要
The role of a highly crystalline and oriented lead titanate ( PTO ) seed layer on the subsequent phase and texture evolution of lead zirconate titanate ( PZT ) thin films is investigated in situ using X‐ray diffraction ( XRD ) during crystallization. Crystalline PTO seed layers were first prepared via a 2‐methoxyethanol route. Amorphous PZT with a Zr/Ti ratio of 52/48 was then deposited on the seed layer using the same synthesis route and subsequently crystallized in situ during XRD . During heating, a tetragonal‐to‐cubic transformation of the seed layer occurs prior to the formation of perovskite PZT . Subsequent nucleation of the crystalline PZT occurs in the cubic phase. Simultaneous to nucleation of PZT , development of a dominant 100 texture component was observed in the PZT phase of the thin films. The results indicate that 100 textured PTO nucleates 100 texture of PZT thin films during crystallization.
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