泊松方程
MOSFET
维数(图论)
解算器
简单(哲学)
二极管
绝缘体上的硅
量子
统计物理学
泊松分布
计算物理学
薛定谔方程
计算机科学
电子工程
物理
数学
量子力学
数学优化
工程类
光电子学
晶体管
电压
哲学
统计
认识论
硅
纯数学
作者
Andreas Wettstein,Andreas Schenk,Wolf Fïchtner
摘要
We describe an implementation of the density-gradient device equations which is simple and works in any dimension without imposing additional requirements on the mesh compared to classical simulations. It is therefore applicable to real-world device simulation with complex geometries. We use our implementation to determine the quantum mechanical effects for a MOS-diode, a MOSFET and a double-gated SOI MOSFET. The results are compared to those obtained by a 1D-Schrodinger-Poisson solver. We also investigate a simplified variant of the density-gradient term and show that, while it can reproduce terminal characteristics, it does not give the correct density distribution inside the device.
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