异质结
光电流
材料科学
光谱学
单层
基质(水族馆)
光电子学
显微镜
激光器
分析化学(期刊)
光学
化学
纳米技术
物理
量子力学
海洋学
色谱法
地质学
作者
Hiroyuki Mogi,Zihan Wang,Takafumi Bamba,Yuhei Takaguchi,Takahiko Endo,Shoji Yoshida,Atsushi Taninaka,Haruhiro Oigawa,Yasumitsu Miyata,Osamu Takeuchi,Hidemi Shigekawa
标识
DOI:10.7567/1882-0786/ab09b9
摘要
By combining scanning multiprobe (MP) microscopy with optical methods such as light-modulated spectroscopy (LMS) and optical pump-probe (OPP) method, we have succeeded in developing a microscopy method for measuring electronic structures and photoinduced carrier dynamics in microscopic structures. We demonstrated its performance by analyzing the electronic structures in a monolayer island of a WSe2/MoSe2 in-plane heterostructure grown on a SiO2/Si substrate. By observing the field-effect transistor characteristics and photocurrent mapping over the heterostructure by LMS, we were able to visualize the band structure. Positional dependence of carrier dynamics was also successfully probed by OPP-MP spectroscopy.
科研通智能强力驱动
Strongly Powered by AbleSci AI