X射线光电子能谱
环境压力
放气
分析化学(期刊)
碳纤维
材料科学
谱线
价(化学)
化学
环境化学
化学工程
物理
有机化学
天文
复合数
工程类
复合材料
热力学
作者
Dhruv Shah,Dhananjay I. Patel,Stephan Bahr,Paul Dietrich,Michael Meyer,Andreas Thißen,Matthew R. Linford
出处
期刊:Surface Science Spectra
[American Vacuum Society]
日期:2019-08-19
卷期号:26 (2)
被引量:15
摘要
Near ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at ca. 2500 Pa, or higher in some cases. With NAP-XPS, XPS can be used to analyze moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey, O 1s, O KLL, and valence band NAP-XPS spectra from liquid water, a material that could not be analyzed at moderate pressures by conventional approaches. The O 1s signal was fit to two components attributed to liquid and vapor phase water. The carbon in the survey spectrum is attributed to contaminants in the water and/or adventitious carbon.
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