折射率
材料科学
基质(水族馆)
光学
镜头(地质)
光电子学
波长
梯度折射率光学
薄膜
焦距
纳米技术
海洋学
物理
地质学
作者
Yuke Ma,Xiangang Xu,Yanxue Chen,Dong Wang
出处
期刊:Optical Engineering
[SPIE - International Society for Optical Engineering]
日期:2020-01-28
卷期号:59 (01): 1-1
标识
DOI:10.1117/1.oe.59.1.017107
摘要
For applications in portable electronic devices and machine vision, a small sized focus-tunable lens or lens system is highly desired. Materials with electrically tunable optical refractive indices are required in these fields. A functional material consisting of a WS2 thin film on a SiC substrate was synthesized and reported in our investigation. A 15-nm-thick WS2 film was deposited on an n-doped SiC substrate (7.37 × 1019 cm − 3) by pulsed laser deposition. The optical refractive index of the WS2 / SiC material was found to be electrically tunable. The value of the effective optical refractive index ranged from 4.03 to 5.84, which implies a 44.9% variation in the refractive index change, at a wavelength of 460 nm under an applied external DC voltage modulated in the range of 0 to 7 V. We also found experimentally that the focal length of the plane lens was tunable from 184 to 156 mm at a wavelength of 650 nm with the applied voltage ranging from 0 to 7 V. Our investigation presents a new way to modulate the refractive index and make the compact focus-tunable lens design convenient.
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