材料科学
氧化物
蚀刻(微加工)
吸附
化学工程
化学气相沉积
相(物质)
气相
沉积(地质)
气相
水蒸气
图层(电子)
纳米技术
有机化学
化学
冶金
生物
古生物学
工程类
沉积物
物理
热力学
作者
Kazuki Nishihara,Masaki Inaba,Hiroaki Takahashi
出处
期刊:Solid State Phenomena
日期:2021-02-01
卷期号:314: 101-106
被引量:2
标识
DOI:10.4028/www.scientific.net/ssp.314.101
摘要
VPC (Vapor Phase Cleaning) is studied to etch various types oxide film using a mixture of HF gas and H 2 O vapor. We focused on controlling the amount of gas molecules adsorbed on the oxide surface and investigated the H 2 O amount included in oxide films, which will contribute to the oxide etching reaction. We have verified that selective etching between different oxide films can be achieved by controlling the gas adhesion amount by varying process parameters and utilizing the different amounts of H 2 O in the oxide films for several deposition methods.
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